Influence of Temperature on Microelectronics System Reliability A Physics of Failure Approach 1st Edition
by Pradeep Lall, Michael G. Pecht
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| Publisher: | Taylor & Francis Group |
| Published In: | 24-Apr-1997 |
| ISBN-10: | 0849394503 |
| ISBN-13: | 9780849394508 |
| Binding Type: | Hardback |
| Weight: | 1125 gms |
| Pages: | pp. 336, 400 equations |
The Title "Influence of Temperature on Microelectronics System Reliability A Physics of Failure Approach 1st Edition" is written by Pradeep Lall. This book was published in the year 1997. The ISBN number 0849394503|9780849394508 is assigned to the Hardback version of this title. This book has total of pp. 336 (Pages). The publisher of this title is Taylor & Francis Group. We have about 157416 other great books from this publisher.