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Built In Test for VLSI Pseudorandom Techniques

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Built In Test for VLSI Pseudorandom Techniques,0471624632,9780471624639

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Book Information

Publisher:John Wiley & Sons
Published In:02-Dec-1987
ISBN-10:0471624632
ISBN-13:9780471624639
Binding Type:Hardback
Weight:778 gms
Pages:pp. 368

The Title "Built In Test for VLSI Pseudorandom Techniques" is written by Paul H. Bardell. This book was published in the year 1987. The ISBN number 0471624632|9780471624639 is assigned to the Hardback version of this title. This book has total of PP. 368 (Pages). The publisher of this title is John Wiley & Sons. We have about 117911 other great books from this publisher. Built In Test for VLSI Pseudorandom Techniques is currently Available with us.

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