Lifetime Spectroscopy A Method of Defect Characterization in Silicon for Photovoltaic Applications 1st Edition
by Stefan Rein
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| Publisher: | Springer |
| Published In: | 23-Jun-2005 |
| ISBN-10: | 3540253033 |
| ISBN-13: | 9783540253037 |
| Binding Type: | Hardback |
| Weight: | 1012 gms |
| Pages: | pp. xxvi + 489 |
The Title "Lifetime Spectroscopy A Method of Defect Characterization in Silicon for Photovoltaic Applications 1st Edition" is written by Stefan Rein. This book was published in the year 2005. The ISBN number 3540253033|9783540253037 is assigned to the Hardback version of this title. This book has total of pp. xxvi + 489 (Pages). The publisher of this title is Springer. We have about 138114 other great books from this publisher. Lifetime Spectroscopy A Method of Defect Characterization in Silicon for Photovoltaic Applications 1st Edition is currently Available with us.