Investigation of Gate Current In Neutron Irradiated AlxGa1-xN/GaN Heterogeneous Field Effect Transistors Using Voltage and Temperature Dependence
by Thomas E. Gray
| Publisher: | Unknows |
| Published In: | 16-Nov-2012 |
| ISBN-10: | 1288308345 |
| ISBN-13: | 9781288308347 |
| Binding Type: | Paperback |
| Weight: | 304 gms |
| Pages: | pp. 128, 50:B&W 7.44 x 9.69 in or 246 x 189 mm (Crown 4vo) Perfect Bound on White w/Gloss |
The Title "Investigation of Gate Current In Neutron Irradiated AlxGa1-xN/GaN Heterogeneous Field Effect Transistors Using Voltage and Temperature Dependence" is written by Thomas E. Gray. This book was published in the year 1620. The ISBN number 1288308345|9781288308347 is assigned to the Paperback version of this title. This book has total of pp. 128 (Pages). The publisher of this title is Unknows. Investigation of Gate Current In Neutron Irradiated AlxGa1-xN/GaN Heterogeneous Field Effect Transistors Using Voltage and Temperature Dependence is currently Not Available with us.You can enquire about this book and we will let you know the availability.