Investigation of interface properties and hot carrier degradation effects in silicon-on-insulator materials and devices
by Yun-Shan Chang
| Publisher: | Unknows |
| Published In: | 27-Aug-2011 |
| ISBN-10: | 1178628892 |
| ISBN-13: | 9781178628890 |
| Binding Type: | Paperback |
| Weight: | 373 gms |
| Pages: | pp. 168, 50:B&W 7.44 x 9.69 in or 246 x 189 mm (Crown 4vo) Perfect Bound on White w/Gloss |
The Title "Investigation of interface properties and hot carrier degradation effects in silicon-on-insulator materials and devices" is written by Yun-Shan Chang. This book was published in the year 2720. The ISBN number 1178628892|9781178628890 is assigned to the Paperback version of this title. This book has total of pp. 168 (Pages). The publisher of this title is Unknows. Investigation of interface properties and hot carrier degradation effects in silicon-on-insulator materials and devices is currently Not Available with us.You can enquire about this book and we will let you know the availability.