Study of gate oxide breakdown and hot electron effect on CMOS circuit performances.
by Jun Ma
| Publisher: | Unknows |
| Published In: | 08-Sep-2011 |
| ISBN-10: | 1243729732 |
| ISBN-13: | 9781243729736 |
| Binding Type: | Paperback |
| Weight: | 316 gms |
| Pages: | pp. 120 |
The Title "Study of gate oxide breakdown and hot electron effect on CMOS circuit performances." is written by Jun Ma. This book was published in the year 0820. The ISBN number 1243729732|9781243729736 is assigned to the Paperback version of this title. This book has total of pp. 120 (Pages). The publisher of this title is Unknows. Study of gate oxide breakdown and hot electron effect on CMOS circuit performances. is currently Not Available with us.You can enquire about this book and we will let you know the availability.