Transmission Electron Microscopy of Semiconductor Nanostructures An Analysis of Composition and Strain State
by Andreas Rosenauer
| Publisher: | Springer |
| Published In: | 2003 |
| ISBN-10: | 3540004149 |
| ISBN-13: | 9783540004141 |
| Binding Type: | Hardback |
| Weight: | 200 gms |
| Pages: | pp. xii + 238, Illus. |
The Title "Transmission Electron Microscopy of Semiconductor Nanostructures An Analysis of Composition and Strain State" is written by Andreas Rosenauer. This book was published in the year 2003. The ISBN number 3540004149|9783540004141 is assigned to the Hardback version of this title. This book has total of pp. xii + 238 (Pages). The publisher of this title is Springer. We have about 237131 other great books from this publisher. Transmission Electron Microscopy of Semiconductor Nanostructures An Analysis of Composition and Strain State is currently Not Available with us.You can enquire about this book and we will let you know the availability.