The Mega Online Bookshop
Welcome Guest | Login | Home | Contact Us
Shopping from USA? Shop in Your Local Currency, Visit http://www.printsasia.com

Visualizing Structure / Property Relationships in Organic Semiconductor Thin Films by Scanning Probe Microscopy.

by  David J Ellison
Visualizing Structure / Property Relationships in Organic Semiconductor Thin Films by Scanning Probe Microscopy.,124905978X,9781249059783

Paperback

Available




We have 3 million other books

Find Another Book

Enquire about this book

Book Information

Publisher:Unknows
Published In:17-Jul-2012
ISBN-10:124905978X
ISBN-13:9781249059783
Binding Type:Paperback
Weight:515 gms
Pages:pp. 224

The Title "Visualizing Structure / Property Relationships in Organic Semiconductor Thin Films by Scanning Probe Microscopy." is written by David J Ellison. This book was published in the year 1720. The ISBN number 124905978X|9781249059783 is assigned to the Paperback version of this title. This book has total of pp. 224 (Pages). The publisher of this title is Unknows. Visualizing Structure / Property Relationships in Organic Semiconductor Thin Films by Scanning Probe Microscopy. is currently Not Available with us.You can enquire about this book and we will let you know the availability.