Visualizing Structure / Property Relationships in Organic Semiconductor Thin Films by Scanning Probe Microscopy.
by David J Ellison
Publisher: | Unknows |
Published In: | 17-Jul-2012 |
ISBN-10: | 124905978X |
ISBN-13: | 9781249059783 |
Binding Type: | Paperback |
Weight: | 515 gms |
Pages: | pp. 224 |
The Title "Visualizing Structure / Property Relationships in Organic Semiconductor Thin Films by Scanning Probe Microscopy." is written by David J Ellison. This book was published in the year 1720. The ISBN number 124905978X|9781249059783 is assigned to the Paperback version of this title. This book has total of pp. 224 (Pages). The publisher of this title is Unknows. Visualizing Structure / Property Relationships in Organic Semiconductor Thin Films by Scanning Probe Microscopy. is currently Not Available with us.You can enquire about this book and we will let you know the availability.