The Mega Online Bookshop
Welcome Guest | Login | Home | Contact Us
Shopping from USA? Shop in Your Local Currency, Visit http://www.printsasia.com

Testing for Small-Delay Defects in Nanoscale CMOS Integrated Circuits 2nd Edition

by  ,
Testing for Small-Delay Defects in Nanoscale CMOS Integrated Circuits 2nd Edition,1439829411,9781439829417

Print on Demand

POD will be shipped in 5 Days.

Ships From London

Free Shipping within U.K

International Shipping?

Check Delivery Estimate and Delivery Charges for your country

Book Information

Publisher:Taylor & Francis Group
Published In:2013
ISBN-10:1439829411
ISBN-13:9781439829417
Binding Type:Hardback
Weight:690 gms
Pages:pp. 250

The Title "Testing for Small-Delay Defects in Nanoscale CMOS Integrated Circuits 2nd Edition" is written by Sandeep K. Goel. This book was published in the year 2013. The ISBN number 1439829411|9781439829417 is assigned to the Hardback version of this title. This book has total of pp. 250 (Pages). The publisher of this title is Taylor & Francis Group. We have about 156956 other great books from this publisher.

Related Books

Circuits at the Nanoscale Communications, Imaging, and Sensing,1420070622,9781420070620

Circuits at the Nano ...

Krzysztof Iniew ...

Our Price: £ 131.45

Nanoscale Technology in Biological Systems 1st Edition,0849319404,9780849319402
1 %

Nanoscale Technology ...

Ralph S. Greco, ...

List Price: £ 153.00

Our Price: £ 152.23

Integrated Optical Circuits and Components Design and Applications,0824775775,9780824775773

Integrated Optical C ...

Edmond J. Murph ...

Our Price: £ 232.46

Analog Circuits and Devices,0849317363,9780849317361

Analog Circuits and ...

Wai-Kai Chen

Our Price: £ 171.90

Digital Circuits Logic and Design,0824773977,9780824773977

Digital Circuits Log ...

Ronald C. Emery

Our Price: £ 222.43

Linear Circuits Systems and Signal Processing: Advanced Theory and Applications,0824781856,9780824781859
34 %

Linear Circuits Syst ...

N. Nagai

List Price: £ 181.00

Our Price: £ 119.19